Patents & publications

Patent

Calibration standard for evanescence microscopy
Martin Oheim, Adi Salomon : Patent # : WO 2020/053367 A1, 2020

Publications

Supercritical angle fluorescence microscopy and spectroscopy (PDF)
Oheim M, Salomon A, Brunstein M : Biophys J, 2020

Fabrication of dipole-aligned thin films of Porphyrin J-aggregates over large surfaces (PDF)
Adam Weissman, Hodaya Klimovsky, Dor Harel, Racheli Ron, Martin Oheim, Adi Salomon : Langmuir, 2020

Calibrating evanescent-wave penetration depths for biological TIRF microscopy (PDF)
Martin Oheim, Adi Salomon, Adam Weissman, Maia Brunstein, Ute Becherer : Biophys J, 2019

Decoding the Information Contained in Fluorophore Radiation Patterns
Maia Brunstein, Adi Salomon, Martin Oheim : ACS Nano, 2018