A Colour-Encoded Nanometric Ruler for Axial Super-Resolution Microscopies
Ilya Olevsko, Omer Shavit, Moshe Feldberg, Yossi Abulafia, Adi Salomon, Martin Oheim : Optics Communications, 2024

Characterizing nanometric thin films with far-field light
Klimovsky H, Shavit O, Julien C, Olevsko I, Hamode M, Abulafia Y, Suaudeau H : Adv Opt Mater, 2023, 2203080

Optometry for a short-sighted microscope
Julien C, Oheim M : Biophys J, 2021

Supercritical angle fluorescence microscopy and spectroscopy (PDF)
Oheim M, Salomon A, Brunstein M : Biophys J, 2020

Fabrication of dipole-aligned thin films of Porphyrin J-aggregates over large surfaces (PDF)
Adam Weissman, Hodaya Klimovsky, Dor Harel, Racheli Ron, Martin Oheim, Adi Salomon : Langmuir, 2020

Calibrating evanescent-wave penetration depths for biological TIRF microscopy (PDF)
Martin Oheim, Adi Salomon, Adam Weissman, Maia Brunstein, Ute Becherer : Biophys J, 2019

Decoding the Information Contained in Fluorophore Radiation Patterns
Maia Brunstein, Adi Salomon, Martin Oheim : ACS Nano, 2018

Near-interface sensing, imaging and nanometrology using smart surfaces
Adi Salomon, Martin Oheim : 2024 in EPJ Web of Conferences (Vol. 309, p. 02003). EDP Sciences.

Detection of refractive index and imperfection in thin film transparent polymer by back focal plane imaging.
Kilmovsky, H., Shavit, O., Oheim, M., & Salomon, A. : 2024 in In EPJ Web of Conferences (Vol. 309, p. 02007). EDP Sciences.