Patent
Calibration standard for evanescence microscopy
Martin Oheim, Adi Salomon : Patent # : WO 2020/053367 A1, 2020
Publications
A Colour-Encoded Nanometric Ruler for Axial Super-Resolution Microscopies
Ilya Olevsko, Omer Shavit, Moshe Feldberg, Yossi Abulafia, Adi Salomon, Martin Oheim : preprint
Characterizing nanometric thin films with far-field light
Klimovsky H, Shavit O, Julien C, Olevsko I, Hamode M, Abulafia Y, Suaudeau H : Adv Opt Mater, 2023, 2203080
Optometry for a short-sighted microscope
Julien C, Oheim M : Biophys J, 2021
Supercritical angle fluorescence microscopy and spectroscopy (PDF)
Oheim M, Salomon A, Brunstein M : Biophys J, 2020
Fabrication of dipole-aligned thin films of Porphyrin J-aggregates over large surfaces (PDF)
Adam Weissman, Hodaya Klimovsky, Dor Harel, Racheli Ron, Martin Oheim, Adi Salomon : Langmuir, 2020
Calibrating evanescent-wave penetration depths for biological TIRF microscopy (PDF)
Martin Oheim, Adi Salomon, Adam Weissman, Maia Brunstein, Ute Becherer : Biophys J, 2019
Decoding the Information Contained in Fluorophore Radiation Patterns
Maia Brunstein, Adi Salomon, Martin Oheim : ACS Nano, 2018